Statistical analysis of degradation modes and mechanisms in various thin-film photovoltaic module technologies

Eric Schneller; Narendra S. Shiradkar; Camila L. Pereira; Leandro C. Fonseca; Neelkanth G. Dhere

doi:10.1117/12.2060727

9 October 2014 Statistical analysis of degradation modes and mechanisms in various thin-film photovoltaic module technologies

Eric Schneller, Narendra S. Shiradkar, Camila L. Pereira, Leandro C. Fonseca, Neelkanth G. Dhere

Author Affiliations +

Proceedings Volume 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII; 917906 (2014) https://doi.org/10.1117/12.2060727
Event: SPIE Solar Energy + Technology, 2014, San Diego, California, United States

Abstract

PV arrays of various thin film modules technologies such as CIGS, rigid single-junction amorphous Silicon (glass-to-glass package) and flexible triple-junction amorphous Silicon have been deployed for over 10 years in hot and humid climate at Florida Solar Energy Center. The performance of selected modules from each array was characterized using visual inspection, dark I-V, flasher I-V, electroluminescence and infrared imaging techniques. Performance was evaluated to determine which, if any, degradation mechanisms are a concern for the long-term reliability of this technology.

Citation Download Citation

Eric Schneller, Narendra S. Shiradkar, Camila L. Pereira, Leandro C. Fonseca, and Neelkanth G. Dhere "Statistical analysis of degradation modes and mechanisms in various thin-film photovoltaic module technologies", Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 917906 (9 October 2014); https://doi.org/10.1117/12.2060727

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