Dynamic temperature field measurements using a polarization phase shifting technique

David Ignacio Serrano-García; Amalia Martínez-García; Noel-Ivan Toto-Arellano; Yukitoshi Otani

doi:10.1117/12.2061840

18 August 2014 Dynamic temperature field measurements using a polarization phase shifting technique

David Ignacio Serrano-García, Amalia Martínez-García, Noel-Ivan Toto-Arellano, Yukitoshi Otani

Proceedings Volume 9204, Interferometry XVII: Advanced Applications; 92040E (2014) https://doi.org/10.1117/12.2061840
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

An optical system capable of simultaneously grabbing three phase-shifted interferometric images was developed for dynamic temperature field measurements outside of a thin flame. The polarization phase shifting technique and a Michelson interferometer that is coupled to a 4-f system with a Ronchi grating placed at the frequency plane are used. This configuration permits the phase-shifted interferograms to be grabbed simultaneously by one CCD. The temperature field measurement is based on measuring the refraction index difference by solving the inverse Abel transform, which requires information obtained by the fringe order localization. Experimental results of a dynamic event are presented varying in time.

Citation Download Citation

David Ignacio Serrano-García, Amalia Martínez-García, Noel-Ivan Toto-Arellano, and Yukitoshi Otani "Dynamic temperature field measurements using a polarization phase shifting technique", Proc. SPIE 9204, Interferometry XVII: Advanced Applications, 92040E (18 August 2014); https://doi.org/10.1117/12.2061840

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KEYWORDS

Polarization

Temperature metrology

Phase shifting

Phase shifts

Fringe analysis

Interferometry

Charge-coupled devices

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