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9 October 2014 Front Matter: Volume 9205
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This PDF file contains the front matter associated with SPIE Proceedings Volume 9205 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Reflection, Scattering, and Diffraction from Surfaces IV, edited by Leonard M. Hanssen, Proceedings of SPIE Vol. 9205 (SPIE, Bellingham, WA, 2014) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628412321

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Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print and on CD-ROM. Papers are published as they are submitted and meet publication criteria. A unique, consistent, permanent citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10–1Z, 20–2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages. Numbers in the index correspond to the last two digits of the six-digit CID Number.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume.

Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10–1Z, 20–2Z, etc.

Airola, Marc B., 03

Alekberov, R. I., 0C

Alonso, Miguel A., 0G

Aubreton, Olivier, 0N

Audo, Frédéric, 0S

Barrett, Harrison H., ix

Basu, Santasri, 0J

Batentschuk, Miroslaw, 0D

Berechet, Ion, 0L

Berechet, Stefan, 0L

Berginc, Gérard, 0K, 0L

Bonaldo, Stefano, 0U

Bouillet, Stéphane, 0S

Brabec, Christoph J., 0D

Brown, Andrea M., 03

Brown, Thomas G., 0G

Butler, Samuel D., 06

Cardimona, Dave A., 04

Caucci, Luca, ix

Chaikina, E. I., 05

Chakrabarti, S., 05

Chang, C. Allen, 0O

Chen, Jian, 07

Chen, Jyh-Cheng, 0O

Chiang, Huihua Kenny, 0O

Chico, Sandrine, 0S

Congdon, Elizabeth A., 03

Corso, Alain Jody, 0U

Daurios, Jérôme, 0S

De los Santos, S. I., 0X

Dong, Jingtao, 07

Drouet, Florence, 0N

Easter, Michelle, 04

Fabritius, Tapio, 0M

Farley, Carlton W., III, 0W

Forberich, Karen, 0D

Freda, Sam, 02

Goryunov, Artem E., 0T

Goshy, John J., 0I

Gumbs, Godfrey, 04

Gupta, Anurag, xxvii

Gür, Bilgehan, 0A

Hahn, Daniel V., 03

Harvey, James E., 0I

Heller, Peter, 0B

Huang, Danhong, 04

Hyde, Milo W., IV, 0J

Isayev, A. I., 0C

Isayeva, G. A., 0C

Jin, Shih-Chun, 0O

Kassu, Aschalew, 0W

Katelevsky, Vadim Y., 0Q

Kuptsov, Vladimir D., 0Q

Laligant, Olivier, 0N

Leppänen, Kimmo, 0M

Lin, Meng-Lung, 0O

Lin, Shawn-Yu, 04

Lin, Syue-Liang, 0O

Lipovšek, Benjamin, 0D

Lo, Pei-An, 0O

Maradudin, A. A., 04, 05

Marciniak, Michael A., 02, 06, 0J

Martinez-Niconoff, G., 0X

Martinez-Vara, P., 0X

Mehoke, Douglas, 03

Mekhtiyeva, S. I., 0C

Meyen, Stephanie, 0B

Munoz-Lopez, J., 0X

Myers, Kyle, ix

Nauyoks, Stephen E., 02

Pachava, Vengalrao, 09

Pavlov, Pavel V., 0T

Pelizzo, Maria Guglielmina, 0U

Petrov, Nikolay V., 0T

Pfisterer, Richard N., 0I

Radchenko, Kostiantyn O., 0V

Raju, M. Esakkimuthu, 09

Ravi, Kumar, 09

Rybin, Evgeniy N., 0Q

Saarela, Juha, 0M

Sadate, Sandra, 0W

Sengupta, Dipankar, 09

Sharma, Anup, 0W

Sharma, Katelynn A., 0G

Simonsen, I., 05

Solodovnyk, Anastasiia, 0D

Spencer, Mark F., 0J

Stern, Edda, 0D

Stolz, Christophe, 0N

Sutter, Florian, 0B

Tessarolo, Enrico, 0U

Thomas, Michael E., 03

Topič, Marko, 0D

Vadakkapattu Canthadai, Badrinath, 09

Valyukhov, Vladimir P., 0Q

van Brug, Hedser, 0A

Vela, Elizabeth, 0A

Wood, James K., 0G

Wu, Zhouling, 07

Xiao, Gang, 07

Xu, Man, 0A

Zabolotna, Natalia I., 0V

Zhang, Xiang, 04

Zuppella, Paola, 0U

3.

Conference Committee

Program Track Chair

  • Katherine Creath, Optineering (United States) and The University of Arizona (United States)

Conference Chair

  • Leonard M. Hanssen, National Institute of Standards and Technology (United States)

Conference Program Committee

  • Gérard Berginc, Thales Optronique S.A.S. (France)

  • Andrea M. Brown, Johns Hopkins University Applied Physics Laboratory (United States)

  • Aristide C. Dogariu, CREOL, The College of Optics and Photonics, University of Central Florida (United States)

  • John C. Fleming, Ball Aerospace & Technologies Corporation (United States)

  • Hsueh-Mei W. Graham, Lockheed Martin Aeronautics Company (United States)

  • Brian G. Hoover, Advanced Optical Technologies (United States)

  • Danhong Huang, Air Force Research Laboratory (United States)

  • Alexei A. Maradudin, University of California, Irvine (United States)

  • Michael A. Marciniak, Air Force Institute of Technology (United States)

  • Richard N. Pfisterer, Photon Engineering LLC (United States)

  • Shouhong Tang, KLA-Tencor Corporation (United States)

  • Benjamin K. Tsai, National Institute of Standards and Technology (United States)

Session Chairs

  • 1 Scatter Instrumentation and Measurement I

    Andrea M. Brown, Johns Hopkins University Applied Physics Laboratory (United States)

  • 2 Scatter Theory and Modeling I

    Gérard Berginc, Thales Optronique S.A.S. (France)

  • 3 Surface Profiling

    John C. Fleming, Ball Aerospace & Technologies Corporation (United States)

  • 4 Scatter Instrumentation and Measurement II

    Michael A. Marciniak, Air Force Institute of Technology (United States)

  • 5 Applications

    Hsueh-Mei W. Graham, Lockheed Martin Aeronautics Company (United States)

  • 6 Scatter Theory and Modeling II

    Danhong Huang, Air Force Research Laboratory (United States)

  • 7 Imaging Methods and Applications

    Richard N. Pfisterer, Photon Engineering LLC (United States)

© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9205", Proc. SPIE 9205, Reflection, Scattering, and Diffraction from Surfaces IV, 920501 (9 October 2014); https://doi.org/10.1117/12.2084706
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