You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
17 September 2014Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research
Ray-tracing algorithms are used to simulate the instrumental function of a synchrotron beamline targeted to the advanced
characterization of nanocrystalline materials by powder diffraction. The characteristics of the source, a bending magnet
in the present case of study, and the optics influence the instrumental profile, which is a key parameter for obtaining
information on the nanostructure.
We combine the SHADOW simulation with the calculation of powder diffraction profiles from standard materials, into a
high-level workflow environment based on the ORANGE software, allowing us to integrate data analysis fitting software
with realistic information.
Luca Rebuffi andPaolo Scardi
"Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research", Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090J (17 September 2014); https://doi.org/10.1117/12.2063745
The alert did not successfully save. Please try again later.
Luca Rebuffi, Paolo Scardi, "Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research," Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090J (17 September 2014); https://doi.org/10.1117/12.2063745