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17 September 2014 Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research
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Abstract
Ray-tracing algorithms are used to simulate the instrumental function of a synchrotron beamline targeted to the advanced characterization of nanocrystalline materials by powder diffraction. The characteristics of the source, a bending magnet in the present case of study, and the optics influence the instrumental profile, which is a key parameter for obtaining information on the nanostructure. We combine the SHADOW simulation with the calculation of powder diffraction profiles from standard materials, into a high-level workflow environment based on the ORANGE software, allowing us to integrate data analysis fitting software with realistic information.
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Luca Rebuffi and Paolo Scardi "Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research", Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090J (17 September 2014); https://doi.org/10.1117/12.2063745
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