Paper
4 November 2014 Harmonisation of two nanosecond laser-induced damage testing facilities at 1064 nm in vacuum and ambient pressure
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Abstract
In this paper we will discuss the challenges of performing comparable laser damage testing as well as a detailed analysis of the measurements conducted on the samples for this harmonisation activity. The goal of the activity is to enlarge the test capacities within ESA’s EarthExplorer space program, especially for the missions ADM Aeolus [5] and EarthCare [6], both having as main payload instruments containing high energy diode pumped nanosecond lasers. Four samples have been compared with the S-on-1 method according to ISO21254-2, two AR1064/0° windows and two silicon wafers leading to an agreement of better than 20% concerning the S-on-1 damage threshold.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Heese, A. Ciapponi, J. Piris, T. Ivanov, P. Allenspacher, M. Lammers, H. Schröder, and W. Riede "Harmonisation of two nanosecond laser-induced damage testing facilities at 1064 nm in vacuum and ambient pressure", Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 923719 (4 November 2014); https://doi.org/10.1117/12.2066847
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KEYWORDS
Laser damage threshold

Laser induced damage

Silicon

Data acquisition

Semiconducting wafers

Damage detection

Diodes

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