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4 November 2014 Toward separation of bulk and interface defects: damage probability analysis of thin film coatings
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Abstract
Nanosecond laser - induced damage threshold (LIDT) of dielectric coatings is limited by absorption of nanometer sized defects inherent to optics manufacturing process. Herewith theoretical and experimental efforts were made in order to characterize internal damage thresholds of defects introduced during substrate polishing and coating deposition processes. For this purpose LIDT testing was performed under UV (355 nm, 4.8 ns) irradiation on three different types of samples by varying irradiation conditions such angle of incident (0°, 45°, 56°) and polarization (s, p). Experimentally obtained damage probability curves were analyzed numerically by employing model considering relative electric field distributions and randomly distributed defect ensembles attributed to distinct manufacturing processes. An attempt is made to identify the layers with the weakest optical resistance.
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Linas Smalakys, Gintarė Batavičiūtė, Egidijus Pupka, and Andrius Melninkaitis "Toward separation of bulk and interface defects: damage probability analysis of thin film coatings", Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 92371Z (4 November 2014); https://doi.org/10.1117/12.2068209
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