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21 August 2014 Uncertainties evaluations in the ray-tracing algorithm based on Monte Carlo method
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Although Ray tracing method is an effective aided design method in optical system, the uncertainty caused by this method is not very clearly. The relationship between the number of rays and uncertainty has been explored in this paper, while using the Monte Carlo algorithm in Ray tracing method. It shows that if the simulation relative deviation should be limited to 0.1%, at least 1000000 rays must be used.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guojin Feng, Ping Li, Yingwei He, Yu Wang, and Houping Wu "Uncertainties evaluations in the ray-tracing algorithm based on Monte Carlo method", Proc. SPIE 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 92830Y (21 August 2014);


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