Performance of extended wavelength InGaAs/InAsP SWIR detector

Gaoqi Cao; Tao Li; Hengjing Tang; Xiumei Shao; Xue Li; Haimei Gong

doi:10.1117/12.2069755

2 September 2014 Performance of extended wavelength InGaAs/InAsP SWIR detector

Gaoqi Cao, Tao Li, Hengjing Tang, Xiumei Shao, Xue Li, Haimei Gong

Proceedings Volume 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging; 928406 (2014) https://doi.org/10.1117/12.2069755
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China

Abstract

The single-pixel extended wavelength mesa InGaAs/InAsP SWIR detector was reported. The properties of the detector were characterized and analyzed at 160K~300K. At the operating temperature of 200K , the dark current density is 1.37×10⁴ nA/cm²(@-10mV), the cut-off wavelength is 2.43μm, the peak detectivity and the peak responsivity are 3.44×10¹¹cmHz^1/2W^-1 and 1.41A/W, respectively. Through analysis of the dark current source, the analysis of reverse dark current indicates that the tunneling current plays an important role at high voltage or relatively low temperature, and at near room temperature and low bias voltage, the generation-recombination current is the main current source instead of ohmic current based on thermal activation energy approximate to E_g/2 and the bias-voltage characteristic of the first order derivative of dark current, while the zero-voltage current mainly consists of the interface current and the thermal background current.

Citation Download Citation

Gaoqi Cao, Tao Li, Hengjing Tang, Xiumei Shao, Xue Li, and Haimei Gong "Performance of extended wavelength InGaAs/InAsP SWIR detector", Proc. SPIE 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging, 928406 (2 September 2014); https://doi.org/10.1117/12.2069755

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available