Paper
22 August 2014 Wavemeter uncertainty evaluation for the calibration of external cavity diode lasers
I. Outumuro , J. L. Valencia, J. Diz-Bugarin, J. Blanco, B. V. Dorrio
Author Affiliations +
Proceedings Volume 9286, Second International Conference on Applications of Optics and Photonics; 92860R (2014) https://doi.org/10.1117/12.2060658
Event: Second International Conference on Applications of Optics and Photonics, 2014, Aveiro, Portugal
Abstract
The uncertainty of a wavemeter has been evaluated taking into account all contributions. This wavemeter was developed to give traceability to the frequency of external cavity diode lasers. These lasers were stabilized and used as light source in the assembly of a new interferometric system for the gauge block calibration. The wavemeter experimental setup is also presented and is based in a Michelson interferometer, a He-Ne laser used as a reference wavelength and a Vernier counter that allowed us to reduce the uncertainty below 1ppm.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. Outumuro , J. L. Valencia, J. Diz-Bugarin, J. Blanco, and B. V. Dorrio "Wavemeter uncertainty evaluation for the calibration of external cavity diode lasers", Proc. SPIE 9286, Second International Conference on Applications of Optics and Photonics, 92860R (22 August 2014); https://doi.org/10.1117/12.2060658
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KEYWORDS
Calibration

Semiconductor lasers

Wavefronts

Laser development

Refractive index

Helium neon lasers

Interferometry

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