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25 November 2014 Optical properties of C-Pd films prepared on silica substrate studied by UV-VIS-NIR spectroscopy
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Proceedings Volume 9290, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014; 929014 (2014) https://doi.org/10.1117/12.2074720
Event: Symposium on Photonics Applications in Astronomy, Communications, Industry and High-Energy Physics Experiments, 2014, Warsaw, Poland
Abstract
In this paper some optical properties of carbonaceous-palladium (C-Pd) thin films investigated using UV-VIS-NIR spectroscopy method are presented. Transmittance and reflectance spectra were measured in 200-3200 nm region. The shape of the spectra were depended on allotropic form of carbon (fullerene) matrix. The refractive coefficients and film thickness of studied materials has been determined based on Thin Film Interference and “envelope” methods. The optical band gap values were also estimated from absorption spectra using Tauc plot extrapolation. The results are in good agreement with experimental data obtained by spectroscopic ellipsometry.
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Radosław Belka, Mirosław Płaza, Małgorzata Suchańska, and Maurizio Ferrari "Optical properties of C-Pd films prepared on silica substrate studied by UV-VIS-NIR spectroscopy ", Proc. SPIE 9290, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014, 929014 (25 November 2014); https://doi.org/10.1117/12.2074720
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