Paper
4 March 2015 A novel one-dimensional phase-shift technique by using crossed fringe for phase measuring deflectometry
Yuankun Liu, Evelyn Olesch, Zheng Yang, Gerd Häusler, Xianyu Su
Author Affiliations +
Proceedings Volume 9302, International Conference on Experimental Mechanics 2014; 93020X (2015) https://doi.org/10.1117/12.2087101
Event: International Conference on Experimental Mechanics 2014, 2014, Singapore, Singapore
Abstract
In principle, PMD needs the two components of the local surface gradient. Therefore a sequence of two orthogonal sinusoidal fringe patterns have to be displayed and captured separately. It is easy and convenient by using a digital display, but it will be much difficult to build a PMD system with mechanic gratings. In this paper, we present a novel phase-shift technique by using the cross fringe pattern, in which a one-dimensional N-phase shift allows for the acquisition of the two orthogonal phases, with only N exposures instead of 2N exposures. Therefore, it make PMD possible be implemented by a one-dimensional translation of the fringe pattern, instead of the common two-dimensional translation, which will be quite useful for certain applications.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuankun Liu, Evelyn Olesch, Zheng Yang, Gerd Häusler, and Xianyu Su "A novel one-dimensional phase-shift technique by using crossed fringe for phase measuring deflectometry", Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93020X (4 March 2015); https://doi.org/10.1117/12.2087101
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Fringe analysis

Phase shifts

Phase shift keying

Deflectometry

3D metrology

Modulation

Imaging systems

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