Paper
4 March 2015 Shifted excitation Raman difference spectroscopy using a dual-wavelength DBR diode laser at 785 nm
M. Maiwald, B. Eppich, J. Fricke, A. Ginolas, F. Bugge, A. Klehr, B. Sumpf, G. Erbert, G. Tränkle
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Abstract
The application of shifted excitation Raman difference spectroscopy (SERDS) using a dual wavelength distributed Bragg reflector (DBR) diode laser at 785 nm will be presented. Both excitation wavelengths necessary for SERDS provide an optical power of more than 160 mW in continuous wave operation. Raman experiments are carried out and demonstrate the suitability of the excitation light source for SERDS. Moreover, a dual-wavelength master-oscillator power amplifier diode laser system is presented. The diode laser system reaches optical powers larger 750 mW while the spectral properties of the dual-wavelength laser remain unchanged.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Maiwald, B. Eppich, J. Fricke, A. Ginolas, F. Bugge, A. Klehr, B. Sumpf, G. Erbert, and G. Tränkle "Shifted excitation Raman difference spectroscopy using a dual-wavelength DBR diode laser at 785 nm", Proc. SPIE 9313, Advanced Biomedical and Clinical Diagnostic and Surgical Guidance Systems XIII, 93130Y (4 March 2015); https://doi.org/10.1117/12.2080922
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Cited by 1 scholarly publication.
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KEYWORDS
Raman spectroscopy

Semiconductor lasers

Laser systems engineering

Spectroscopy

Light sources

Molybdenum

Optical amplifiers

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