A new method to achieve tens of nm axial super-localization based on conical diffraction PSF shaping

Clément Fallet; Maxime Dubois; Jean-Yves Tinevez; Stephane Oddos; Julien Caron; Roger Persson; Spencer L. Shorte; Gabriel Y. Sirat

doi:10.1117/12.2077712

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9 March 2015 A new method to achieve tens of nm axial super-localization based on conical diffraction PSF shaping

Clément Fallet, Maxime Dubois, Jean-Yves Tinevez, Stephane Oddos, Julien Caron, Roger Persson, Spencer L. Shorte, Gabriel Y. Sirat

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Proceedings Volume 9331, Single Molecule Spectroscopy and Superresolution Imaging VIII; 93310Q (2015) https://doi.org/10.1117/12.2077712
Event: SPIE BiOS, 2015, San Francisco, California, United States

Abstract

We present a method for Z-super-localization in fluorescence microscopy, based on conical diffraction. By using a thin biaxial crystal, the Point Spread Function (PSF) shape of an objective is made to depend strongly on the z coordinate. This z dependence is then exploited to localize fluorescent emitters axially with a great precision. We study how this method can be used for single molecule imaging with a global assessment by Fisher information analysis. Preliminary experiments demonstrate that this technique can obtain resolutions of tens of nm with the use of high NA objectives.

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Clément Fallet, Maxime Dubois, Jean-Yves Tinevez, Stephane Oddos, Julien Caron, Roger Persson, Spencer L. Shorte, and Gabriel Y. Sirat "A new method to achieve tens of nm axial super-localization based on conical diffraction PSF shaping", Proc. SPIE 9331, Single Molecule Spectroscopy and Superresolution Imaging VIII, 93310Q (9 March 2015); https://doi.org/10.1117/12.2077712

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