Characterization of sidewall Bragg gratings using optical low-coherence interferometry with a broadband source

Chen Zhang; Xin Wang; Christi K. Madsen

doi:10.1117/12.2080104

2 April 2015 Characterization of sidewall Bragg gratings using optical low-coherence interferometry with a broadband source

Chen Zhang, Xin Wang, Christi K. Madsen

Author Affiliations +

Proceedings Volume 9365, Integrated Optics: Devices, Materials, and Technologies XIX; 93651G (2015) https://doi.org/10.1117/12.2080104
Event: SPIE OPTO, 2015, San Francisco, California, United States

Abstract

In this work, we present fabrication and measurement of sidewall Bragg gratings in chalcogenide arsenic tri-sulfide (As2S3) on titanium-diffused lithium niobate (Ti:LiNbO3) channel waveguides. The transfer matrix method was used to analyze the temporal and spectral response of the sidewall gratings in the mid-infrared. The waveguide sidewall Bragg gratings were fabricated by electron-beam lithography (EBL), metal liftoff and subsequent reactive-ion etching (RIE). Insertion loss of the mid-infrared Ti:LiNbO3 optical waveguides were measured at ~2 dB and the propagation loss was estimated to be 0.45 dB/cm. Configuration of an optical low-coherence interferometer that is capable of characterizing the mid-infrared sidewall grating-based devices was experimentally implemented and preliminary results from fiber Bragg gratings are presented.

Citation Download Citation

Chen Zhang, Xin Wang, and Christi K. Madsen "Characterization of sidewall Bragg gratings using optical low-coherence interferometry with a broadband source", Proc. SPIE 9365, Integrated Optics: Devices, Materials, and Technologies XIX, 93651G (2 April 2015); https://doi.org/10.1117/12.2080104

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