The area of applicability of apparatus for analyzing the spectral characteristics of reflection, albedo and color parameters of flat objects

Elena V. Gorbunova; Aleksandr N. Chertov; Vladimir S. Peretyagin; Elena A. Lastovskaia; Valery V. Korotaev

doi:10.1117/12.2081568

6 April 2015 The area of applicability of apparatus for analyzing the spectral characteristics of reflection, albedo and color parameters of flat objects

Elena V. Gorbunova, Aleksandr N. Chertov, Vladimir S. Peretyagin, Elena A. Lastovskaia, Valery V. Korotaev

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Proceedings Volume 9369, Photonic Instrumentation Engineering II; 93690X (2015) https://doi.org/10.1117/12.2081568
Event: SPIE OPTO, 2015, San Francisco, California, United States

Abstract

Quality control of different coatings (colorful, paint, marker, safety, etc.) that are applied to the surface of various objects (both metallic and non-metallic) is an important problem. Also, there is a problem of dealing with counterfeit products. So it’s necessary to distinguish the fake replicas of marking from the authentic marking of producer. To solve these problems, we propose an automated apparatus for analysis and control of spectral reflection characteristics, albedo and color parameters of extended (up to 150 mm × 150 mm) flat objects. It allows constructing the color image of the object surface as well as its multispectral images in different regions of the spectrum. Herewith the color of the object surface can be calculated for various standard light sources (A, B, C, D65, E, F2, F7, F11, GE), or to any light source with a predetermined emission spectrum. The paper presents the description of working principles of the proposed apparatus as well as the results of reflection and multispectral analysis of different flat objects.

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Elena V. Gorbunova, Aleksandr N. Chertov, Vladimir S. Peretyagin, Elena A. Lastovskaia, and Valery V. Korotaev "The area of applicability of apparatus for analyzing the spectral characteristics of reflection, albedo and color parameters of flat objects", Proc. SPIE 9369, Photonic Instrumentation Engineering II, 93690X (6 April 2015); https://doi.org/10.1117/12.2081568

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KEYWORDS

Reflection

Multispectral imaging

Reflectivity

Mirrors

Helium neon lasers

Light sources

Calibration

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