You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
27 February 2015Spatially resolved contrast measurement of diffractive micromirror arrays
Diffractive micromirror arrays (MMA) are a special class of optical MEMS, serving as spatial light modulators (SLM)
that control the phase of reflected light. Since the surface profile is the determining factor for an accurate phase
modulation, high-precision topographic characterization techniques are essential to reach highest optical performance.
While optical profiling techniques such as white-light interferometry are still considered to be most suitable to this task,
the practical limits of interferometric techniques start to become apparent with the current state of optical MEMS
technology. Light scatter from structured surfaces carries information about their topography, making scatter techniques
a promising alternative. Therefore, a spatially resolved scatter measurement technique, which takes advantage of the
MMA’s diffractive principle, has been implemented experimentally. Spectral measurements show very high contrast
ratios (up to 10 000 in selected samples), which are consistent with calculations from micromirror roughness parameters
obtained by white-light interferometry, and demonstrate a high sensitivity to changes in the surface topography. The
technique thus seems promising for the fast and highly sensitive characterization of diffractive MMAs.
The alert did not successfully save. Please try again later.
Cornelius Sicker, Jörg Heber, Dirk Berndt, Florian Rückerl, Jean-Yves Tinevez, Spencer Shorte, Michael Wagner, Harald Schenk, "Spatially resolved contrast measurement of diffractive micromirror arrays," Proc. SPIE 9375, MOEMS and Miniaturized Systems XIV, 93750D (27 February 2015); https://doi.org/10.1117/12.2076921