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The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publishers are not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this book: Author(s), “Title of Paper,” in Measuring, Modeling, and Reproducing Material Appearance 2015, edited by Maria V. Ortiz Segovia, Philipp Urban, Francisco H. Imai, Proceedings of SPIE-IS&T Electronic Imaging, SPIE Vol. 9398, Article CID Number (2015) ISSN: 0277-786X ISBN: 9781 628414882 Copublished by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 and IS&T-The Society for Imaging Science and Technology 7003 Kilworth Lane, Springfield, Virginia, 22151 USA Telephone +1 703 642 9090 (Eastern Time)· Fax +1 703 642 9094 Copyright © 2015, Society of Photo-Optical Instrumentation Engineers and The Society for Imaging Science and Technology. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by the publishers subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00. Printed in the United States of America. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:
Authors Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc. Arikan, Can Ates, 0S Audenaert, Jan, 0D Avery, Michael P., 0R Baar, Teun, 0T, 0V, 0W Baba, Kaori, 05 Barbier, Justine, 0Q Barla, Pascal, 08 Bartlett, Paul, 0R Bel cour, Laurent, 08 Bernad, Berta, 0E Berns, Roy S., 03 Besbes, Mondher, 0U Bignon, Thibault, 0H Blahová, Jana, 0L, 0V Boher, Pierre, 0H Bosch, Carles, 08 Brettel, Hans, 0T Brunton, Alan, 0S Callet, P., 04 Campos, Joaquín, 0E Cartwright, Luke, 06 Cazier, Anthony, 0Q, 0U Chavel, Pierre, 0U Collomb-Patton, Véronique, 0H Cox, Brittany D., 03 da Graça, F., 04 Deboos, Alexis, 0U Dekker, Niels, 0L den Brok, Dennis, 0A, 0F Désage, Simon-Frédéric, 0K Dik, Joris, 0W Elkhuizen, Willemijn S., 0W Evey, Curtis, 0M Fairchild, Mark D., 0G Fan, Hua-Tzu, 0M Farup, Ivar, 0J Favrelière, Hugues, 0K Ferrero, Alejandro, 0E Filip, Ji í, 0P Fores, Adria, 0G Frei, Regina, 0R Frelin, Fabrice, 0K Ged, Guillaume, 0D Geraedts, Jo M. P., 0W Haindl, Michal, 07 Hauer, Kai-Olaf, 0O Havlícek, Vojtěch, 07 Hébert, Mathieu, 0I, 0Q, 0U Henckens, Lambert, 0Q Hernanz, M. Luisa, 0E Hirose, Misa, 09 Hoarau, R., 04 Höpe, Andreas, 0O Huertas, Rafael, 0L Hugonin, Jean-Paul, 0U Hullin, Matthias B., 0A, 0F Hünerhoff, Dirk, 0O Iacomussi, P., 0N Kirchner, Eric, 0L Klein, Reinhard, 0A, 0F Klein, Susanne, 0R Kuang, Deng-Feng, 0U Le Goïc, Gaëtan, 0K Leboulleux, Lucie, 0Q Leloup, Frederic B., 0D Lenseigne, Boris A. J., 0W Leroux, Thierry, 0H Lockerman, Yitzhak, 06 Lucassen, Marcel, 0L Maire, Jean-Luc, 0K Mallet, Maxime, 0U Martín, Rodrigo, 0A Martínez-García, Juan, 0I Meseth, Jan, 0M Meyer, Gary, 0M Muller, T., 04 Muñoz, Adolfo, 08 Njo, Lan, 0L Obein, Gael, 0D Ogawa-Ochiai, Keiko, 09 Ojima, Nobutoshi, 09 Ortiz Segovia, Maria V., 0T, 0V Page, Marine, 0Q Paljic, A., 04 Pillet, Maurice, 0K Pitard, Gilles, 0K Pitera, David, 06 Pons, Alicia, 0E Porral, P., 04 Radis, M., 0N Reměs, Václav, 07 Richardson, Robert, 0R Rossi, G., 0N Roujas, Lucie, 0Q Rushmeier, Holly, 06 Samadzadegan, Sepideh, 0V Sambongi, Masao, 05 Samper, Serge, 0K Schnackenberg, Ryan, 0M Seubert, Christopher, 0M Simske, Steven, 0R Sole, Aditya S., 0J Steinhausen, Heinz C., 0A, 0F Strothkämper, Christian, 0O Tanksale, Tejas Madan, 0S Tastl, Ingeborg, 0G Teichert, Sven, 0O Tempelman, Erik, 0W Tominaga, Shoji, 0J Toyota, Saori, 09 Trémeau, Alain, 0I Tsumura, Norimichi, 05, 09 Urban, Philipp, 0L, 0S, 0V Valpreda, F., 0X van der Lans, Ivo, 0L Vávra, Radomír, 0P Verhofstad, Wim, 0W Yamamoto, Shoji, 05 Zubiaga, Carlos J., 08 Conference Committee Symposium Chair Symposium Co-chair Conference Chairs
Conference Program Committee
Session Chairs
IntroductionThe rapid and continuous development of rendering devices, such as displays and printers, offers interesting challenges related to how materials are understood. Over the years, researchers from different disciplines have studied the interaction of incident light with the texture and surface geometry of a given object, as well as the optical properties of distinct materials. Thanks to those efforts, we have been able to render with high accuracy 2.5D and 3D objects and scenes. But given the day-to-day technological improvements of materials and devices, along with the advances in the areas of visual and tactile perception, modeling how light interacts with materials, and techniques for measuring material properties, the field of material appearance is in constant evolution. This conference offers the possibility to share research results and establish new collaborations among academic and industrial researchers from these related fields. The main topics encountered on the papers of this document correspond to any of the following categories:
Maria V. Ortiz Segovia Philipp Urban Francisco H. Imai |
