New generation of Fourier optics instruments for fast multispectral BRDF characterization

Pierre Boher; Thierry Leroux; Véronique Collomb-Patton; Thibault Bignon

doi:10.1117/12.2077600

13 March 2015 New generation of Fourier optics instruments for fast multispectral BRDF characterization

Pierre Boher, Thierry Leroux, Véronique Collomb-Patton, Thibault Bignon

Proceedings Volume 9398, Measuring, Modeling, and Reproducing Material Appearance 2015; 93980H (2015) https://doi.org/10.1117/12.2077600
Event: SPIE/IS&T Electronic Imaging, 2015, San Francisco, California, United States

Abstract

A new generation of Fourier optics multispectral instruments that allow rapid full diffused or collimated beam spectral BRDF measurements is presented. Light detection is made simultaneously at all angular locations including the illumination direction. Backscattering effect in the fields of cosmetics and parasitic reflection of mobile displays are reported as examples.

Citation Download Citation

Pierre Boher, Thierry Leroux, Véronique Collomb-Patton, and Thibault Bignon "New generation of Fourier optics instruments for fast multispectral BRDF characterization", Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 93980H (13 March 2015); https://doi.org/10.1117/12.2077600

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