Surveillance Sensor Test Chamber: System Design Concepts Of Internal Calibrator And Of Calibration Sources

Rudolf H. Meier; Clyde A. Randolph

doi:10.1117/12.947139

14 July 1988 Surveillance Sensor Test Chamber: System Design Concepts Of Internal Calibrator And Of Calibration Sources

Rudolf H. Meier, Clyde A. Randolph

Proceedings Volume 0940, Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling; (1988) https://doi.org/10.1117/12.947139
Event: 1988 Technical Symposium on Optics, Electro-Optics, and Sensors, 1988, Orlando, FL, United States

Abstract

The internal calibration system of a newly designed surveillance sensor test chamber and a novel approach of generating a multitude of identical thermal point sources are described and discussed.

Citation Download Citation

Rudolf H. Meier and Clyde A. Randolph "Surveillance Sensor Test Chamber: System Design Concepts Of Internal Calibrator And Of Calibration Sources", Proc. SPIE 0940, Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling, (14 July 1988); https://doi.org/10.1117/12.947139

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