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13 March 2015 Design considerations for a low-noise CMOS image sensor
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Proceedings Volume 9403, Image Sensors and Imaging Systems 2015; 94030P (2015)
Event: SPIE/IS&T Electronic Imaging, 2015, San Francisco, California, United States
This paper reports a Low-Noise CMOS Image Sensor. Low-noise operation is achieved owing to the combination of a noise-enhanced pixel, the use of a two-step ADC architecture and the analysis, and the optimization thereof, of the noise contributed by the readout channel. The paper basically gathers the sensor architecture, the ADC converter architecture, the outcome of the noise analysis and some basic characterization data. The general low-noise design framework is discussed in the companion presentation.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ana González-Márquez, Alexandre Charlet, Alberto Villegas, Francisco Jiménez-Garrido, Fernando Medeiro, Rafael Domínguez-Castro, and Ángel Rodríguez-Vázquez "Design considerations for a low-noise CMOS image sensor", Proc. SPIE 9403, Image Sensors and Imaging Systems 2015, 94030P (13 March 2015);


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