Paper
18 March 2015 A pattern-based methodology for optimizing stitches in double-patterning technology
Author Affiliations +
Abstract
A pattern-based methodology for optimizing stitches is developed based on identifying stitch topologies and replacing them with pre-characterized fixing solutions in decomposed layouts. A topology-based library of stitches with predetermined fixing solutions is built. A pattern-based engine searches for matching topologies in the decomposed layouts. When a match is found, the engine opportunistically replaces the predetermined fixing solution: only a design rule check error-free replacement is preserved. The methodology is demonstrated on a 20nm layout design that contains over 67 million, first metal layer stitches. Results show that a small library containing 3 stitch topologies improves the stitch area regularity by 4x.
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Lynn T.-N. Wang, Sriram Madhavan, Vito Dai, and Luigi Capodieci "A pattern-based methodology for optimizing stitches in double-patterning technology", Proc. SPIE 9427, Design-Process-Technology Co-optimization for Manufacturability IX, 942704 (18 March 2015); https://doi.org/10.1117/12.2085955
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KEYWORDS
Image classification

Manufacturing

Lithography

Double patterning technology

Bismuth

Library classification systems

Metals

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