Selective disturbance rejection algorithms for mitigating non-common path errors within beam control systems

Edwin S. Ahn; Richard A. Carreras; J. Steve Gibson

doi:10.1117/12.2177504

22 May 2015 Selective disturbance rejection algorithms for mitigating non-common path errors within beam control systems

Edwin S. Ahn, Richard A. Carreras, J. Steve Gibson

Author Affiliations +

Proceedings Volume 9467, Micro- and Nanotechnology Sensors, Systems, and Applications VII; 94671Z (2015) https://doi.org/10.1117/12.2177504
Event: SPIE Defense + Security, 2015, Baltimore, MD, United States

Abstract

The beam control system of a high energy laser (HEL) application can typically experience error amplification due to disturbance measurements that are associated with the non-common path of the optical train setup. In order to address this error, conventional schemes require offline identification or a calibration process to determine the non-common path error portion of a measured sequence that contains both common and non-common path disturbances. However, not only is it a challenging to model the properties of the non-common path disturbance alone but also a stationary model may not guarantee consistent jitter control performance and repeated calibration may be necessary. The paper first attempts to classify the non-common path error problem into two categories where the designer is only given one measurement or two measurements available for real-time processing. For the latter case, an adaptive correlated pre-filter is introduced here to provide in situ determination of the non-common path disturbance through an adaptive correlation procedure. Contrasting features and advantages of this algorithm will be demonstrated alongside a baseline approach of utilizing notch filters to bypass the non-common portion of the combined sequence.

Citation Download Citation

Edwin S. Ahn, Richard A. Carreras, and J. Steve Gibson "Selective disturbance rejection algorithms for mitigating non-common path errors within beam control systems", Proc. SPIE 9467, Micro- and Nanotechnology Sensors, Systems, and Applications VII, 94671Z (22 May 2015); https://doi.org/10.1117/12.2177504

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