Paper
19 May 2015 Long wave infrared 3D scanner
Ernst Wiedenmann, Mohsen Afrough, Sven Albert, Robert Schott, Jan Tusch, Andreas Wolf
Author Affiliations +
Abstract
In industrial metrology, the system of fringe projection for the fast determination of 3D surface data has been established. The combination of areal and structured projection with two-dimensional optical sensors and triangulation measurement principle allows very high measurement point densities with reasonable accuracy. There are great difficulties with high gloss surfaces and with very dark surfaces for state of the art systems. Transparent materials cannot be measured using the visible spectrum of light. We have therefore developed a new structured light projection system that solves these problems. For the first time the physical principle of energy conversion is utilized in areal structured light projection. We are presenting first results to show the advantages and the capability of this new measurement principle.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ernst Wiedenmann, Mohsen Afrough, Sven Albert, Robert Schott, Jan Tusch, and Andreas Wolf "Long wave infrared 3D scanner", Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 94890G (19 May 2015); https://doi.org/10.1117/12.2076111
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Cited by 1 scholarly publication.
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KEYWORDS
Infrared radiation

Absorption

Cameras

Infrared cameras

Projection systems

Structured light

Visible radiation

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