Paper
22 June 2015 Electrooptic converter to control linear displacements of the large structures of the buildings and facilities
Aleksandr S. Vasilev, Igor A. Konyakhin, Alexander N. Timofeev, Oleg U. Lashmanov, Fedor V. Molev
Author Affiliations +
Abstract
The paper analyzes the construction matters and metrological parameters of the electrooptic converter to control linear displacements of the large structures of the buildings and facilities. The converter includes the base module, the processing module and a set of the reference marks. The base module is the main unit of the system, it includes the receiving optical system and the CMOS photodetector array that realizes the instrument coordinate system that controls the mark coordinates in the space. The methods of the frame-to-frame difference, adaptive threshold filtration, binarization and objects search by the tied areas to detect the marks against accidental contrast background is the basis of the algorithm. The entire algorithm is performed during one image reading stage and is based on the FPGA. The developed and manufactured converter experimental model was tested in laboratory conditions at the metrological bench at the distance between the base module and the mark 50±0.2 m. The static characteristic was read during the experiment of the reference mark displacement at the pitch of 5 mm in the horizontal and vertical directions for the displacement range 400 mm. The converter experimental model error not exceeding ±0.5 mm was obtained in the result of the experiment.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aleksandr S. Vasilev, Igor A. Konyakhin, Alexander N. Timofeev, Oleg U. Lashmanov, and Fedor V. Molev "Electrooptic converter to control linear displacements of the large structures of the buildings and facilities", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252W (22 June 2015); https://doi.org/10.1117/12.2184528
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Cited by 4 scholarly publications.
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KEYWORDS
Control systems

Buildings

Electro optics

Electro optical modeling

Image processing

Metrology

Temperature metrology

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