Paper
14 July 2015 Laser damage measurement techniques for the femtosecond regime
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Abstract
Laser-induced damage is defined as any permanent laser-induced change in the characteristics of a sample. This change can be observed by many different inspection techniques, with different sensitivity, depending on the intended objectives and available techniques. The damage threshold definition and measurement are therefore very subjective and related to the detection method. The choice and implementation of a damage test system is then a critical issue on any experiment. In this work we present some implementation of detection techniques for laser damage metrology in the sub-picosecond regime. Different damage testing methods that have been applied will be discussed in view of their potential applications for testing functional optical components or to study physical process in the femtosecond regime, particularly the role of defects: optical microscopy, phase microscopy and time-resolved microscopy.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D.-B. L. Douti, M. Chrayteh, A. Melninkaitis, S. Monneret, M. Commandré, and L. Gallais "Laser damage measurement techniques for the femtosecond regime", Proc. SPIE 9532, Pacific Rim Laser Damage 2015: Optical Materials for High-Power Lasers, 953219 (14 July 2015); https://doi.org/10.1117/12.2185775
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KEYWORDS
Laser induced damage

Microscopes

Microscopy

Cameras

Femtosecond phenomena

Phase imaging

Image processing

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