An Interpretation Of Moire Tnterferometry From Wavefront Interference Theory

Fu-long Dai; James McKelvie; Daniel Post

doi:10.1117/12.947581

16 January 1989 An Interpretation Of Moire Tnterferometry From Wavefront Interference Theory

Fu-long Dai, James McKelvie, Daniel Post

Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947581
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States

Abstract

The process of moire interferometry is given mathematical description in terms of the classical theory of optical interference. The governing relationship between displacement and fringe order is derived, and the analysis is extended to cover carrier patterns, double exposure methods, and initial fringe pattern elimination. Various processes for obtaining patterns of displacement derivatives are also described mathematically.

Citation Download Citation

Fu-long Dai, James McKelvie, and Daniel Post "An Interpretation Of Moire Tnterferometry From Wavefront Interference Theory", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947581

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