Some New Techniques For Imaging Through Inhomogeneities

E. N. Leith; A. Cunha

doi:10.1117/12.947565

16 January 1989 Some New Techniques For Imaging Through Inhomogeneities

E. N. Leith, A. Cunha

Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947565
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States

Abstract

Several processes of image formation through inhomogeneities are compared: double-pass phase conjugation, single-pass phase conjugation, and superresolution. The phase conjugation processes can each be combined with the superresolution process, giving rise to more generalized methods of image formation through inhomogeneities.

Citation Download Citation

E. N. Leith and A. Cunha "Some New Techniques For Imaging Through Inhomogeneities", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947565

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