A new, fast and accurate spectrophotometric method for the determination of the optical constants of arbitrary absorptance thin films from a single transmittance curve: application to dielectric materials

Jean Desforges; Clément Deschamps; Serge Gauvin

doi:10.1117/12.2197139

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20 August 2015 A new, fast and accurate spectrophotometric method for the determination of the optical constants of arbitrary absorptance thin films from a single transmittance curve: application to dielectric materials

Jean Desforges, Clément Deschamps, Serge Gauvin

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Proceedings Volume 9558, Nanostructured Thin Films VIII; 95580F (2015) https://doi.org/10.1117/12.2197139
Event: SPIE Nanoscience + Engineering, 2015, San Diego, California, United States

Abstract

The determination of the complex refractive index of thin films usually requires the highest accuracy. In this paper, we report on a new and accurate method based on a spectral rectifying process of a single transmittance curve. The agreements with simulated and real experimental data show the helpfulness of the method. The case of materials having arbitrary absorption bands at midpoint in spectral range, such as pigments in guest-host polymers, is also encompassed by this method.

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Jean Desforges, Clément Deschamps, and Serge Gauvin "A new, fast and accurate spectrophotometric method for the determination of the optical constants of arbitrary absorptance thin films from a single transmittance curve: application to dielectric materials", Proc. SPIE 9558, Nanostructured Thin Films VIII, 95580F (20 August 2015); https://doi.org/10.1117/12.2197139

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