Fundamental performance differences of CMOS and CCD imagers: part VI

James Janesick; Tom Elliott; James Andrews; John Tower

doi:10.1117/12.2189941

31 August 2015 Fundamental performance differences of CMOS and CCD imagers: part VI

James Janesick, Tom Elliott, James Andrews, John Tower

Proceedings Volume 9591, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV; 959102 (2015) https://doi.org/10.1117/12.2189941
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

Past papers demonstrated advancements made on developing scientific PMOS/NMOS CMOS imagers that match or exceed CCD performance. New data and discussions presented in this paper present further progress on subject matters that include: 1). subcarrier read noise performance with understandings for how the noise floor can be reduced further, 2). comprehensive correlated double sampling (CDS) signal processing noise fundamentals in response to random telegraph and flicker noise sources, 3). high energy radiation damage test data from NASA's BSI SoloHi/WISPR CMOS imager and 4). update on a new scientific BSI PMOS/NMOS stitched Mk x Nk x 10 um 5TPPD pixel imager being fabricated for Lawrence Livermore National Lab (LLNL) and NASA's Europa Clipper mission.

Citation Download Citation

James Janesick, Tom Elliott, James Andrews, and John Tower "Fundamental performance differences of CMOS and CCD imagers: part VI", Proc. SPIE 9591, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV, 959102 (31 August 2015); https://doi.org/10.1117/12.2189941

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