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18 September 2015 FXI: a full-field imaging beamline at NSLS-II
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Abstract
The Full-field X-ray Imaging (FXI) beamline at the NSLS-II is designed for optimum performance of a transmission x-ray microscope (TXM). When complete, FXI will enable the TXM to obtain individual 2D projection images at 30 nm spatial resolution and up to 40 microns field of view (FOV) with exposure times of < 50 ms per image. A complete 3D nanotomography data set should take less than 1 minute. This will open opportunities for many real-time in-operando studies.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wah-Keat Lee, Ruben Reininger, William Loo, Richard Gambella, Steven O'Hara, Yong S. Chu, Zhong Zhong, and Jun Wang "FXI: a full-field imaging beamline at NSLS-II", Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 959209 (18 September 2015); https://doi.org/10.1117/12.2189914
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