Ultra high throughput four-reflection x-ray telescope for high resolution spectroscopy

Yuzuru Tawara; Ikuyuki Mitsuishi; Yasunori Babazaki; Ren Nakamichi; Ayako Bandai

doi:10.1117/12.2187922

4 September 2015 Ultra high throughput four-reflection x-ray telescope for high resolution spectroscopy

Yuzuru Tawara, Ikuyuki Mitsuishi, Yasunori Babazaki, Ren Nakamichi, Ayako Bandai

Proceedings Volume 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII; 96030D (2015) https://doi.org/10.1117/12.2187922
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

The first application of four-times reflection X-ray optics is planned for the DIOS mission, in which very soft X-ray observation is expected. On the other hand, effective area of the telescope for higher X-ray energy (E < 10 keV) including iron K emission lines has been so far limited to about 1000 cm² for assumed several meter focal length. However, if we introduce four-reflection optics to this energy range, we can get several times large effective area for single telescope with same several meter focal length. To prove this possibility, we performed ray tracing simulation for four-reflection telescope with 6 m focal length and found that effective area of 3100 cm² at 6 keV can be obtained for single telescope. In this paper, we will discuss about other telescope performances, mechanical properties and application to fine spectroscopic mission using X-ray micro-calorimeter.

Citation Download Citation

Yuzuru Tawara, Ikuyuki Mitsuishi, Yasunori Babazaki, Ren Nakamichi, and Ayako Bandai "Ultra high throughput four-reflection x-ray telescope for high resolution spectroscopy", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96030D (4 September 2015); https://doi.org/10.1117/12.2187922

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KEYWORDS

Mirrors

X-ray telescopes

Telescopes

X-ray optics

X-rays

Optical instrument design

Spatial resolution

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