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21 September 2015 EUV multilayer coatings for solar imaging and spectroscopy
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This paper describes recent progress in the development of new EUV multilayer coatings for solar physics. In particular, we present results obtained with Pd/B4C/Y, Al/Zr, and Al-Mg/SiC multilayers, designed for normal incidence operation in the 9 – 50 nm wavelength range. We describe the development of both periodic multilayer films designed for narrowband imaging, and non-periodic multilayers designed to have a broad-spectral response for spectroscopy. The higher EUV reflectance provided by these new coatings, relative to older-generation coatings such as Si/Mo, Mo/Y, and others, will facilitate the development of future solar physics instruments for both imaging and spectroscopy having higher spatial and spectral resolution, while supporting the exposure times and cadences necessary to capture the evolution of flares, jets, CMEs and other dynamic processes in the solar atmosphere.
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David L. Windt "EUV multilayer coatings for solar imaging and spectroscopy", Proc. SPIE 9604, Solar Physics and Space Weather Instrumentation VI, 96040P (21 September 2015);

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