Primary calibration of solar cells based on DSR method at the National Institute of Metrology of China

Yingwei He; Limin Xiong; Junchao Zhang; Haifeng Meng; Chuan Cai; Bifeng Zhang; Linlin Xie; Dingpu Liu

doi:10.1117/12.2191490

7 August 2015 Primary calibration of solar cells based on DSR method at the National Institute of Metrology of China

Yingwei He, Limin Xiong, Junchao Zhang, Haifeng Meng, Chuan Cai, Bifeng Zhang, Linlin Xie, Dingpu Liu

Proceedings Volume 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 96230S (2015) https://doi.org/10.1117/12.2191490
Event: International Conference on Optical Instruments and Technology 2015, 2015, Beijing, China

Abstract

A primary standard measurement facility based on differential spectral responsivity (DSR) method for calibration of reference solar cells was realized at National Institute of Metrology (NIM), China. The primary calibration of the critical spectral parameters and short-circuit current of reference cells, not only with WPVS (World photovoltaic Scale) design but with non-regularly shaped, can be performed by this standard facility. The linearity measurement can be carried out by measuring DSR of the solar cells at different bias levels in the spectral range from 300nm to 1200nm. The characterization and performance of the facility were reported. An uncertainty of 0.9% (k=2) for short-circuit current of WPVS reference solar cells was able to be obtained. A more accurate and better calibration service for solar photovoltaic (PV) cells could be provided to local or international solar cell research community, testing labs and industry users and manufacturers.

Citation Download Citation

Yingwei He, Limin Xiong, Junchao Zhang, Haifeng Meng, Chuan Cai, Bifeng Zhang, Linlin Xie, and Dingpu Liu "Primary calibration of solar cells based on DSR method at the National Institute of Metrology of China", Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230S (7 August 2015); https://doi.org/10.1117/12.2191490

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