Single emitter localization analysis in the presence of background

S. Stallinga

doi:10.1117/12.2192043

23 September 2015 Single emitter localization analysis in the presence of background

S. Stallinga

Proceedings Volume 9630, Optical Systems Design 2015: Computational Optics; 96300V (2015) https://doi.org/10.1117/12.2192043
Event: SPIE Optical Systems Design, 2015, Jena, Germany

Abstract

Localization microscopy for imaging at the nano-scale relies on the quality of fitting the emitter positions from the measured light spots. The type and magnitude of the noise in the detection process, the background light level and the Point Spread Function model that is used in the fit are of paramount importance for the precision and accuracy of the fit. We present several developments on the computational methods and performance limits of single emitter localization, targeting specifically these three aspects.

Citation Download Citation

S. Stallinga "Single emitter localization analysis in the presence of background", Proc. SPIE 9630, Optical Systems Design 2015: Computational Optics, 96300V (23 September 2015); https://doi.org/10.1117/12.2192043

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