A Vapor Leak Sensor Using Polarization Property For Plant Inspection

Toshiro Nakajima; Mitsuhito Kamei

doi:10.1117/12.948012

27 January 1989 A Vapor Leak Sensor Using Polarization Property For Plant Inspection

Toshiro Nakajima, Mitsuhito Kamei

Proceedings Volume 0965, Current Developments in Optical Engineering III; (1989) https://doi.org/10.1117/12.948012
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

This paper deals with the development of a vapor leak sensor for plant inspection. The sensor requires the ability to selectively detect troubles in various circumstances. The method to detect vapor leak is based on the detection of scattered light. The experiment on polarization property shows that there is large difference between the scattered light from vapor and that from structures in a plant, and that the method is effective for the distinction of the two scattered lights. As a result of our experiment, it is confirmed that the sensor enables us to selectively detect the vapor leak with high sensitivity even in a plant and has high performance for plant inspection.

Citation Download Citation

Toshiro Nakajima and Mitsuhito Kamei "A Vapor Leak Sensor Using Polarization Property For Plant Inspection", Proc. SPIE 0965, Current Developments in Optical Engineering III, (27 January 1989); https://doi.org/10.1117/12.948012

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