An accurate projector gamma correction method for phase-measuring profilometry based on direct optical power detection

Miao Liu; Shibin Yin; Shourui Yang; Zonghua Zhang

doi:10.1117/12.2199669

8 October 2015 An accurate projector gamma correction method for phase-measuring profilometry based on direct optical power detection

Miao Liu, Shibin Yin, Shourui Yang, Zonghua Zhang

Author Affiliations +

Proceedings Volume 9677, AOPC 2015: Optical Test, Measurement, and Equipment; 96771D (2015) https://doi.org/10.1117/12.2199669
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China

Abstract

Digital projector is frequently applied to generate fringe pattern in phase calculation-based three dimensional (3D) imaging systems. Digital projector often works with camera in this kind of systems so the intensity response of a projector should be linear in order to ensure the measurement precision especially in Phase-Measuring Profilometry (PMP). Some correction methods are often applied to cope with the non-linear intensity response of the digital projector. These methods usually rely on camera and gamma function is often applied to compensate the non-linear response so the correction performance is restricted by the dynamic range of camera. In addition, the gamma function is not suitable to compensate the nonmonotonicity intensity response. This paper propose a gamma correction method by the precisely detecting the optical energy instead of using a plate and camera. A photodiode with high dynamic range and linear response is used to directly capture the light optical from the digital projector. After obtaining the real gamma curve precisely by photodiode, a gray level look-up table (LUT) is generated to correct the image to be projected. Finally, this proposed method is verified experimentally.

Citation Download Citation

Miao Liu, Shibin Yin, Shourui Yang, and Zonghua Zhang "An accurate projector gamma correction method for phase-measuring profilometry based on direct optical power detection", Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96771D (8 October 2015); https://doi.org/10.1117/12.2199669

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