Paper
25 October 2016 Control of lateral thickness gradients of EUV/soft x-ray multilayer on curved substrates
Bo Yu, Chun-shui Jin, Shun Yao
Author Affiliations +
Abstract
To meet the requirements of wavelength matching and figure preservation for EUV multilayer optics, study of precise control of the lateral thickness gradients of multilayer was performed. The distribution of the magnetron sputtering source was derived by fitting the coating thickness profiles of flat substrates sweeping across the source with constant velocity at different heights using genetic algorithm. Then, genetic algorithm was also used in finding the proper speed profiles for the desired thickness profiles. By the method mentioned above, extremely precise control of the lateral thickness gradients of multilayer on curved substrates was realized.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bo Yu, Chun-shui Jin, and Shun Yao "Control of lateral thickness gradients of EUV/soft x-ray multilayer on curved substrates", Proc. SPIE 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870A (25 October 2016); https://doi.org/10.1117/12.2246160
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KEYWORDS
Multilayers

Sputter deposition

Coating

Mirrors

Genetic algorithms

X-rays

Extreme ultraviolet

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