Translator Disclaimer
Presentation + Paper
9 March 2016 Resolving the depth of fluorescent light by structured illumination and shearing interferometry
Author Affiliations +
Proceedings Volume 9718, Quantitative Phase Imaging II; 97182H (2016)
Event: SPIE BiOS, 2016, San Francisco, California, United States
A method for the depth-sensitive detection of fluorescent light is presented. It relies on a structured illumination restricting the excitation volume and on an interferometric detection of the wave front curvature. The illumination with two intersecting beams of a white-light laser separated in a Sagnac interferometer coupled to the microscope provides a coarse confinement in lateral and axial direction. The depth reconstruction is carried out by evaluating shearing interferograms produced with a Michelson interferometer. This setup can also be used with spatially and temporally incoherent light as emitted by fluorophores.

A simulation workflow of the method was developed using a combination of a solution of Maxwell's equations with the Monte Carlo method. These simulations showed the principal feasibility of the method.

The method is validated by measurements at reference samples with characterized material properties, locations and sizes of fluorescent regions. It is demonstrated that sufficient signal quality can be obtained for materials with scattering properties comparable to dental enamel while maintaining moderate illumination powers in the milliwatt range. The depth reconstruction is demonstrated for a range of distances and penetration depths of several hundred micrometers.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Johannes Schindler, Ahmed Elmaklizi, Florian Voit, Ansgar Hohmann, Philipp Schau, Nicole Brodhag, Philipp Krauter, Karsten Frenner, Alwin Kienle, and Wolfgang Osten "Resolving the depth of fluorescent light by structured illumination and shearing interferometry", Proc. SPIE 9718, Quantitative Phase Imaging II, 97182H (9 March 2016);

Back to Top