Paper
22 April 2016 Measurement of pressure broadening of the Kr absorption line at 811.3 nm with a diode laser
Pavel A. Mikheyev, Alexander K. Churnyshov, Nikolay I. Ufimtsev, Anna R. Ghildina, Valery N. Azyazov, Michael C. Heaven
Author Affiliations +
Abstract
Optically pumped all-rare-gas laser (OPRGL) with unique properties was recently proposed. To study this promising laser system it is necessary to have reliable diagnostics for the active medium. A set of pressure broadening coefficients, for self- and foreign- gas collision partners, is needed for measurements of the number density of metastable atoms and temperature in a rare gas discharge plasma by means of spectroscopy. However, literature analysis had shown that pressure broadening coefficients for rare gas lines in mixtures that are of interest for OPRGL’s are surprisingly hard to find, or were not yet measured. Diode laser absorption spectroscopy was employed for measurements of pressure broadening coefficients for the Krypton 811.3 nm line in an RF discharge. A multi-quantum well diode laser (L808P030, Thorlabs) with an original short external cavity was used as a source of probe radiation. The natural isotopic distribution of Kr was taken into account, and an appropriate fit function was constructed. This permitted the determination of pressure broadening coefficients using the natural mixture of isotopes. The coefficients for the Kr 811.3 nm line at 300 K, measured for the first time, were ξKr-Ne = (1.50 ± 0.05) ×10-10 s-1cm3 for broadening by Neon, and ξKr-Ar = (3.5 ± 0.3) ×10-10 s-1cm3 for broadening by Argon.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavel A. Mikheyev, Alexander K. Churnyshov, Nikolay I. Ufimtsev, Anna R. Ghildina, Valery N. Azyazov, and Michael C. Heaven "Measurement of pressure broadening of the Kr absorption line at 811.3 nm with a diode laser", Proc. SPIE 9729, High Energy/Average Power Lasers and Intense Beam Applications IX, 97290E (22 April 2016); https://doi.org/10.1117/12.2218349
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Krypton

Semiconductor lasers

Neon

Argon

Absorption

Tunable lasers

Diagnostics

Back to Top