Reliability study on high power 638-nm triple emitter broad area laser diode

T. Yagi; K. Kuramoto; K. Kadoiwa; R. Wakamatsu; M. Miyashita

doi:10.1117/12.2211851

4 March 2016 Reliability study on high power 638-nm triple emitter broad area laser diode

T. Yagi, K. Kuramoto, K. Kadoiwa, R. Wakamatsu, M. Miyashita

Proceedings Volume 9733, High-Power Diode Laser Technology and Applications XIV; 973305 (2016) https://doi.org/10.1117/12.2211851
Event: SPIE LASE, 2016, San Francisco, California, United States

Abstract

Reliabilities of the 638-nm triple emitter broad area laser diode (BA-LD) with the window-mirror structure were studied. Methodology to estimate mean time to failure (MTTF) due to catastrophic optical mirror degradation (COMD) in reasonable aging duration was newly proposed. Power at which the LD failed due to COMD (P_COMD) was measured for the aged LDs under the several aging conditions. It was revealed that the P_COMD was proportional to logarithm of aging duration, and MTTF due to COMD (MTTF(COMD)) could be estimated by using this relation. MTTF(COMD) estimated by the methodology with the aging duration of approximately 2,000 hours was consistent with that estimated by the long term aging. By using this methodology, the MTTF of the BA-LD was estimated exceeding 100,000 hours under the output of 2.5 W, duty cycles of 30% .

Citation Download Citation

T. Yagi, K. Kuramoto, K. Kadoiwa, R. Wakamatsu, and M. Miyashita "Reliability study on high power 638-nm triple emitter broad area laser diode", Proc. SPIE 9733, High-Power Diode Laser Technology and Applications XIV, 973305 (4 March 2016); https://doi.org/10.1117/12.2211851

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