Optical resonators metrology using an RF-spectrum approach

Zeina Abdallah; Yann G. Boucher; Arnaud Fernandez; Stéphane Balac; Olivier Llopis

doi:10.1117/12.2210786

25 February 2016 Optical resonators metrology using an RF-spectrum approach

Zeina Abdallah, Yann G. Boucher, Arnaud Fernandez, Stéphane Balac, Olivier Llopis

Proceedings Volume 9747, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX; 97470E (2016) https://doi.org/10.1117/12.2210786
Event: SPIE OPTO, 2016, San Francisco, California, United States

Abstract

A Microwave domain characterization technique is proposed to measure the optical properties of high quality factor optical resonators, featuring a very high precision in frequency which can be as good as 1 Hz. It aims to acquire a full knowledge of the complex transfer function (amplitude and phase) characterizing these resonators. It is shown that the amplitude response gives access to the measure of several parameters like the free spectral range and the quality factor. Moreover the phase transition at the resonance is used to define the coupling regime and to calculate the resonator parameters: transmission coefficient and intra-cavity losses.

Citation Download Citation

Zeina Abdallah, Yann G. Boucher, Arnaud Fernandez, Stéphane Balac, and Olivier Llopis "Optical resonators metrology using an RF-spectrum approach", Proc. SPIE 9747, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX, 97470E (25 February 2016); https://doi.org/10.1117/12.2210786

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