Raman and CT scan mapping of chalcogenide glass diffusion generated gradient index profiles

G. P. Lindberg; R. H. Berg; J. Deegan; R. Benson; P. S. Salvaggio; N. Gross; B. A. Weinstein; D. Gibson; S. Bayya; J. Sanghera; V. Nguyen; M. Kotov

doi:10.1117/12.2223775

17 May 2016 Raman and CT scan mapping of chalcogenide glass diffusion generated gradient index profiles

G. P. Lindberg, R. H. Berg, J. Deegan, R. Benson, P. S. Salvaggio, N. Gross, B. A. Weinstein, D. Gibson, S. Bayya, J. Sanghera, V. Nguyen, M. Kotov

Author Affiliations +

Proceedings Volume 9822, Advanced Optics for Defense Applications: UV through LWIR; 98220W (2016) https://doi.org/10.1117/12.2223775
Event: SPIE Defense + Security, 2016, Baltimore, MD, United States

Abstract

Metrology of a gradient index (GRIN) material is non-trivial, especially in the realm of infrared and large refractive index. Traditional methods rely on index matching fluids which are not available for indexes as high as those found in the chalcogenide glasses (2.4-3.2). By diffusing chalcogenide glasses of similar composition one can blend the properties in a continuous way. In an effort to measure this we will present data from both x-ray computed tomography scans (CT scans) and Raman mapping scans of the diffusion profiles. Proof of concept measurements on undiffused bonded sheets of chalcogenide glasses were presented previously. The profiles measured will be of axially stacked sheets of chalcogenide glasses diffused to create a linear GRIN profile and nested tubes of chalcogenide glasses diffused to create a radial parabolic GRIN profile. We will show that the x-ray absorption in the CT scan and the intensity of select Raman peaks spatially measured through the material are indicators of the concentration of the diffusion ions and correlate to the spatial change in refractive index. We will also present finite element modeling (FEM) results and compare them to post precision glass molded (PGM) elements that have undergone CT and Raman mapping.

Citation Download Citation

G. P. Lindberg, R. H. Berg, J. Deegan, R. Benson, P. S. Salvaggio, N. Gross, B. A. Weinstein, D. Gibson, S. Bayya, J. Sanghera, V. Nguyen, and M. Kotov "Raman and CT scan mapping of chalcogenide glass diffusion generated gradient index profiles", Proc. SPIE 9822, Advanced Optics for Defense Applications: UV through LWIR, 98220W (17 May 2016); https://doi.org/10.1117/12.2223775

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Chalcogenide glass

Raman spectroscopy

Computed tomography

Diffusion

GRIN lenses

Gradient-index optics

Finite element methods

Show All Keywords

Keywords/Phrases

Search In:

Publication Years