Neutron Reflectivity Of Ni-Si Multilayers

J. B Al -Dabbagh; B L Evans

doi:10.1117/12.948769

16 December 1988 Neutron Reflectivity Of Ni-Si Multilayers

J. B Al -Dabbagh, B L Evans

Proceedings Volume 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers; (1988) https://doi.org/10.1117/12.948769
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

The neutron reflectivity spectra of Ni-aimultilayers has been measured as a function of angle of incidence and neutron wavelength in the range 1-7Å. The measurements are discussed in terms of the fabrication method employed and compared with the corresponding X-ray reflectivity spectra.

Citation Download Citation

J. B Al -Dabbagh and B L Evans "Neutron Reflectivity Of Ni-Si Multilayers", Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); https://doi.org/10.1117/12.948769

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