Banana orchard inventory using IRS LISS sensors

Nilay Nishant; Gargi Upadhayay; S. P. Vyas; K. R. Manjunath

doi:10.1117/12.2228062

30 April 2016 Banana orchard inventory using IRS LISS sensors

Nilay Nishant, Gargi Upadhayay, S. P. Vyas, K. R. Manjunath

Proceedings Volume 9880, Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications VI; 98800J (2016) https://doi.org/10.1117/12.2228062
Event: SPIE Asia-Pacific Remote Sensing, 2016, New Delhi, India

Abstract

Banana is one of the major crops of India with increasing export potential. It is important to estimate the production and acreage of the crop. Thus, the present study was carried out to evolve a suitable methodology for estimating banana acreage. Area estimation methodology was devised around the fact that unlike other crops, the time of plantation of banana is different for different farmers as per their local practices or conditions. Thus in order to capture the peak signatures, biowindow of 6 months was considered, its NDVI pattern studied and the optimum two months were considered when banana could be distinguished from other competing crops. The final area of banana for the particular growing cycle was computed by integrating the areas of these two months using LISS III data with spatial resolution of 23m. Estimated banana acreage in the three districts were 11857Ha, 15202ha and 11373Ha for Bharuch, Anand and Vadodara respectively with corresponding accuracy of 91.8%, 90% and 88.16%. Study further compared the use of LISS IV data of 5.8m spatial resolution for estimation of banana using object based as well as per-pixel classification and the results were compared with statistical reports for both the approaches. In the current paper we depict the various methodologies to accurately estimate the banana acreage.

Citation Download Citation

Nilay Nishant, Gargi Upadhayay, S. P. Vyas, and K. R. Manjunath "Banana orchard inventory using IRS LISS sensors", Proc. SPIE 9880, Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications VI, 98800J (30 April 2016); https://doi.org/10.1117/12.2228062

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available