Paper
27 April 2016 Direct sub-micron microstructuring on cylinder using TiO2 sol-gel process and radial phase mask based lithography
L. Berthod, F. Vocanson, M. Langlet, C. Veillas, S. Reynaud, I. Verrier, J. Laukkanen, O. Parriaux, Y. Jourlin
Author Affiliations +
Abstract
Design and fabrication of a high efficiency phase mask have been performed for printing submicron period gratings along 8 mm diameter glass cylinders. In this article, the authors present the radial phase mask specially designed and manufactured for a cylindrical surface micro-structuring under UV photolithography. Its period is sub-micron (480 nm < ΛPM < 720 nm). The authors describe then the phase mask based UV lithography set-up using the interference between the transmitted beams of +1 and -1 orders generated by the phase mask. Preliminary results of printed gratings on a cylinder are described on a sol-gel TiO2 thin film layer, enabling direct photo patterning on functionalized layer. The feasibility of a grating printed with a period of Λcylin = 960 nm on an 8 mm diameter cylinder with this dedicated mask has been demonstrated.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Berthod, F. Vocanson, M. Langlet, C. Veillas, S. Reynaud, I. Verrier, J. Laukkanen, O. Parriaux, and Y. Jourlin "Direct sub-micron microstructuring on cylinder using TiO2 sol-gel process and radial phase mask based lithography", Proc. SPIE 9888, Micro-Optics 2016, 988808 (27 April 2016); https://doi.org/10.1117/12.2227700
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photomasks

Lithography

Sol-gels

Optical lithography

Diffraction gratings

Titanium dioxide

Ultraviolet radiation

RELATED CONTENT

Multilevel Ge-Se Film Based Resist Systems
Proceedings of SPIE (June 30 1982)
New High Speed Positive Resist For Wafer Steppers
Proceedings of SPIE (September 13 1982)
Nanometer x-ray lithography
Proceedings of SPIE (October 08 1999)

Back to Top