Development and characterization of high refractive index and high scattering acrylate polymer layers

Thomas Eiselt; Guillaume Gomard; Jan Preinfalk; Uwe Gleissner; Uli Lemmer; Thomas Hanemann

doi:10.1117/12.2227327

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27 April 2016 Development and characterization of high refractive index and high scattering acrylate polymer layers

Thomas Eiselt, Guillaume Gomard, Jan Preinfalk, Uwe Gleissner, Uli Lemmer, Thomas Hanemann

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Proceedings Volume 9888, Micro-Optics 2016; 98880Q (2016) https://doi.org/10.1117/12.2227327
Event: SPIE Photonics Europe, 2016, Brussels, Belgium

Abstract

The aim is to develop a polymer layer which has the ability to diffuse light homogeneously and exhibit a high refractive index. The mixtures are containing an acrylate casting resin, benzylmethacrylate, phenanthrene and other additives. Phenanthrene is employed to increase the refractive index. The mixtures are first rheologically characterized and then polymerized with heat and UV radiation. For the refractive index measurements the polymerized samples require a planar surface without air bubbles. To produce flat samples a special construction consisting of a glass plate, a teflon sheet, a silicone ring (PDMS mold), another teflon sheet and another glass plate is developed. Glue clamps are used to fix this construction together. Selected samples have a refractive index of 1.585 at 20°C at a wavelength of 589nm. A master mixture with a high refractive index is taken for further experiments. Nano scaled titanium dioxide is added and dispersed into the master mixture and then spin coated on a glass substrate. These layers are optically characterized. The specular transmission and the overall transmission are measured to investigate the degree of scattering, which is defined as the haze. Most of the presented layers express the expected haze of over 50%.

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Thomas Eiselt, Guillaume Gomard, Jan Preinfalk, Uwe Gleissner, Uli Lemmer, and Thomas Hanemann "Development and characterization of high refractive index and high scattering acrylate polymer layers", Proc. SPIE 9888, Micro-Optics 2016, 98880Q (27 April 2016); https://doi.org/10.1117/12.2227327

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