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29 July 2016Manufacturing and alignment tolerance analysis through Montecarlo approach for PLATO
Demetrio Magrin,1 Roberto Ragazzoni,1 Maria Bergomi,1 Federico Biondi,1 Simonetta Chinellato,1 Marco Dima,1 Jacopo Farinato,1 Davide Greggio,1,2 Marco Gullieuszik,1 Luca Marafatto,1 Valentina Viotto,1 Matteo Munari,3 Isabella Pagano,3 Daniela Sicilia,3 Stefano Basso,4 Francesco Borsa,4 Mauro Ghigo,4 Daniele Spigahttps://orcid.org/0000-0003-1163-7843,4 Timothy Bandy,5 Mathias Brändli,5 Willy Benz,5 Giordano Bruno,5 Thierry De Roche,5 Daniele Piazza,5 Martin Rieder,5 Alexis Brandeker,6 Maximilian Klebor,7 Valery Mogulsky,8 Mario Schweitzer,8 Matthias Wieser,7 Anders Erikson,9 Heike Rauer9
1INAF - Osservatorio Astronomico di Padova (Italy) 2Univ. degli Studi di Padova (Italy) 3INAF - Osservatorio Astrofisico di Catania (Italy) 4INAF - Osservatorio Astronomico di Brera (Italy) 5Univ. of Bern (Switzerland) 6Stockholm Univ. (Sweden) 7OHB System AG (Germany) 8OHB-System AG (Germany) 9DLR - Institut für Planetenforschung (Germany)
The project PLAnetary Transits and Oscillations of stars (PLATO) is one of the selected medium class (M class)
missions in the framework of the ESA Cosmic Vision 2015-2025 program. The main scientific goal of PLATO is the
discovery and study of extrasolar planetary systems by means of planetary transits detection.
According to the current baseline, the scientific payload consists of 34 all refractive telescopes having small aperture
(120mm) and wide field of view (diameter greater than 37 degrees) observing over 0.5-1 micron wavelength band. The
telescopes are mounted on a common optical bench and are divided in four families of eight telescopes with an
overlapping line-of-sight in order to maximize the science return. Remaining two telescopes will be dedicated to support
on-board star-tracking system and will be specialized on two different photometric bands for science purposes.
The performance requirement, adopted as merit function during the analysis, is specified as 90% enclosed energy
contained in a square having size 2 pixels over the whole field of view with a depth of focus of +/-20 micron. Given the
complexity of the system, we have followed a Montecarlo analysis approach for manufacturing and alignment
tolerances. We will describe here the tolerance method and the preliminary results, speculating on the assumed risks and
expected performances.