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26 July 2016 Keck Planet Imager and Characterizer: concept and phased implementation
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The Keck Planet Imager and Characterizer (KPIC) is a cost-effective upgrade path to the W.M. Keck observatory (WMKO) adaptive optics (AO) system, building on the lessons learned from first and second-generation extreme AO (ExAO) coronagraphs. KPIC will explore new scientific niches in exoplanet science, while maturing critical technologies and systems for future ground-based (TMT, EELT, GMT) and space-based planet imagers (HabEx, LUVOIR). The advent of fast low-noise IR cameras (IR-APD, MKIDS, electron injectors), the rapid maturing of efficient wavefront sensing (WFS) techniques (Pyramid, Zernike), small inner working angle (IWA) coronagraphs (e.g., vortex) and associated low-order wavefront sensors (LOWFS), as well as recent breakthroughs in high contrast high resolution spectroscopy, open new direct exoplanet exploration avenues that are complementary to planet imagers such as VLT-SPHERE and the Gemini Planet Imager (GPI). For instance, the search and detailed characterization of planetary systems on solar-system scales around late-type stars, mostly beyond SPHERE and GPI's reaches, can be initiated now at WMKO.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Mawet, P. Wizinowich, R. Dekany, M. Chun, D. Hall, S. Cetre, O. Guyon, J. K. Wallace, B. Bowler, M. Liu, G. Ruane, E. Serabyn, R. Bartos, J. Wang, G. Vasisht, M. Fitzgerald, A. Skemer, M. Ireland, J. Fucik, J. Fortney, I. Crossfield, R. Hu, and B. Benneke "Keck Planet Imager and Characterizer: concept and phased implementation", Proc. SPIE 9909, Adaptive Optics Systems V, 99090D (26 July 2016);


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