Presentation
3 November 2016 Single crystal diamond boron 'delta doped' nanometric layers for 2D electronic devices (Conference Presentation)
James Butler
Author Affiliations +
Abstract
Use of diamond as a semiconductor material suffers from the high activation energy of all known impurity dopants (0.37 eV for Boron, 0.6 eV for Phosphorous). To achieve the simultaneous carrier concentration and mobility desired for devices operating at room temperature, growth of a nanometric thick ‘delta’ layer doped to above the metal insulator transition adjacent to high mobility intrinsic material can provide a 2D high mobility conduction layer. Critical to obtaining the enhanced mobility of the carriers in the layer next to the ‘delta’ doped layer is the abruptness of the doping interface. Single and multiple nanometer thick epitaxial layers of heavily boron ‘delta’ doped diamond have been grown on high quality, intrinsic lab grown diamond single crystals. These layers were grown in a custom microwave plasma activated chemical vapor deposition reactor based on a rapid reactant switching technique. Characterization of the ‘delta’ layers by various analytical techniques will be presented. Electrical measurements demonstrating enhanced hole mobility (100 to 800 cm2/V sec) as well as other electrical characterizations will be presented.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Butler "Single crystal diamond boron 'delta doped' nanometric layers for 2D electronic devices (Conference Presentation)", Proc. SPIE 9932, Carbon Nanotubes, Graphene, and Emerging 2D Materials for Electronic and Photonic Devices IX, 99320F (3 November 2016); https://doi.org/10.1117/12.2239939
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KEYWORDS
Diamond

Boron

Crystals

Electronic components

Doping

Interfaces

Metals

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