Black synthetic quartz glass layer for optical fiber cross-talk reduction fabricated by VAD method

Soichi Kobayashi; Kaoru Fukuda; Gen Onishi; Yusuke Fujii

doi:10.1117/12.2237666

Translator Disclaimer

27 September 2016 Black synthetic quartz glass layer for optical fiber cross-talk reduction fabricated by VAD method

Soichi Kobayashi, Kaoru Fukuda, Gen Onishi, Yusuke Fujii

Author Affiliations +

Proceedings Volume 9950, Laser Beam Shaping XVII; 99500V (2016) https://doi.org/10.1117/12.2237666
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

In this report the new black-glass fiber-preform fabricated by the vapor-phase axial deposition (VAD) method to realize high-resolution optical bundle fibers is discussed with the Energy Dispersive X-ray (EDX) analysis and the transmittance spectrum measurement. The black glass consists of SiO₂, GeO₂, Bi₂O₃ and Al₂O₃. Firstly, the rod-shaped soot of SiO₂ and GeO₂ is prepared by blowing SiCl₄ and GeCl₄ into the oxyhydrogen burner. Then the soot is dipped into the solution of the Bi and Al compounds. After drying the soot with Bi and Al penetrated, the soot is consolidated into the glass preform by heating with the carbon heater at 1650 degrees Celsius. The diameter of the obtained preform is 10.5 mm and the black glass layer thickness is 2.6 mm located at the periphery. The Bi concentration distribution shows the content of several wt% in the black glass layer. The black glass preform is drawn into the black optical fiber being expected to make a clear image because of no light leaking from the neighboring optical fibers as compared to the conventional fiber endoscope.

Citation Download Citation

Soichi Kobayashi, Kaoru Fukuda, Gen Onishi, and Yusuke Fujii "Black synthetic quartz glass layer for optical fiber cross-talk reduction fabricated by VAD method", Proc. SPIE 9950, Laser Beam Shaping XVII, 99500V (27 September 2016); https://doi.org/10.1117/12.2237666

ACCESS THE FULL ARTICLE